Jul 30 2007
PULSION® is the new robust and versatile Plasma Immersion Equipment designed by IBS. This low or very low energy ion implanter which is a digest of the whole technological know-how of ION BEAM SERVICES allows achieving very small implantation depths.
Product Description
- Substrate size: up to 3OOmm
- Energy: 0-12 keV
- Current: 0,1µA – 50mA
- Process gases: Dopants (BF3, PH3, AsH3 …)
All gases are possible upon request.
- As implanted “junction depth” : Down to 2nm, linear with acceleration voltage
- Low metal contamination: < 1E11 / cm²
- Uniformity and reproducibility:
σ = 2,5 % on 200 mm (BF3 0,5 kV 3000 §Ù/sq)
σ = 1,4 % on 300 mm (BF3 10 kV 50 §Ù/sq)
- Plasma density: 107 - 1010 cm-3
- Working pressure: 10-4 - 10-2 mbar
- Continuous or pulsed mode
Applications
Due to these characteristics, this brand new equipment is especially dedicated to semiconductors applications. Successful process tests have been done in the following fields:
- Ultra Shallow Junctions: S/D extensions, detectors;
- Highly Doped Surfaces, low cost Doping: Poly Silicon Doping, Power Devices, Solar cells;
- 3D Doping, Trench doping: Finfets, Memories;
- Surface Modification for Nanotechnology: Nanocristals, high K, workfunction modification.
Main Advantages
With regards to classical beamline ion implanters, PULSION® main advantages lie in its inner characteristics:
- Great flexibility in doping penetration depth due to a large energy range (from very low to medium);
- Low cost of ownership and thus a low cost doping;
- 200-300mm Cluster type Equipment;
- Reduced footprint.