Nov 28 2007
Oxford Instruments’ pursuit of excellence continues with the launch of its Analytical Silicon Drift Detector (SDD) INCAx-act with unique patented PentaFET Precision.
The radial SDD sensor has been designed specifically for excellent low energy performance and mapping at high count rates, providing users with high-quality qualitative and quantitative results.
The result is a high quality Analytical SDD detector which has allowed Oxford Instruments to introduce a guaranteed Carbon resolution on their INCAx-act detector. This makes it the world’s only EDS Silicon Drift Detector to offer ISO 15632:2002 resolution compliance.
Oxford Instruments is also pleased to announce that from 26th November all customers who have already placed an order for INCAx-act will receive this upgraded detector with PentaFET inside.