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Results 11 - 20 of 141 for Dynamic Force Spectroscopy
  • FUJIFILM Dimatix
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    FUJIFILM Dimatix, Inc., the world's leading supplier of drop-on-demand inkjet printheads for industrial applications, is driving a revolution in inkjet technology to support a new generation of...
  • Oxford Instruments Nanoscience
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    Creating high performance cryogenic and cryogen free environments for ultra low temperature and high magnetic field applications in physics, chemistry and materials science research down to the atomic...
  • RHK Technology
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    RHK delivers compelling value and proven quality to broaden the frontiers of atomic scale research. We stand ready to meet your specifications and exceed your expectations. RHK’s surface...
  • Sigma Aldrich
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    Sigma-Aldrich® is a leading high-technology company. Through our Materials Chemistry Centers of Excellence in research and manufacturing we develop advanced, enabling materials for your...
  • Molecular Vista
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    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Nanjing University Researcher Uses JPK AFM Instrumentation for Single Molecule Force Spectroscopy
    News - 11 Mar 2014
    JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the study of how force regulates the structures and...
  • Anasys AFM-IR Technology Used by University of Illinois for Nanoscale Chemical Identification
    News - 30 Apr 2013
    Anasys Instruments reports on the recent publication from the University of Illinois which describes the development of a novel technique for chemical identification at the nanometer scale based on...
  • AFM-IR Reveals Chemical Properties of Polymer Nanostructures
    News - 11 Mar 2013
    Dynamic analysis reveals the chemical composition of polymer nanostructures For more than 20 years, researchers have been using atomic force microscopy (AFM) to measure and characterize...
  • Using Scanning Microwave Impedance Microscopy for Nanoscale Mapping of Permittivity and Conductivity
    Article - 25 May 2016
    Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.
  • Expanding Research and Discovery in Nano Science
    Article - 18 Aug 2022
    In this interview, Dr. Heiko Haschke, Director BioAFM Business, Bruker Nano Surfaces and Metrology Division talks to AZoNano about the company, the products they list and the research they carry out.

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