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  • Supplier Profile
    PI is a privately held company that designs and manufactures world-class precision motion and automation systems including air bearings, hexapods, and piezo drives at locations in North America,...
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    DECTRIS develops and manufactures the most accurate X-ray and electron cameras to spark scientific breakthroughs around the world. While photographic cameras capture visible light, DECTRIS cameras...
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    Raith is a leading precision technology solution provider for nanofabrication, electron beam lithography, focused ion beam fabrication, nanoengineering and reverse engineering applications. Customers...
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    PI is a privately held company that designs and manufactures world-class precision motion and automation systems including air bearings, hexapods, and piezo drives at locations in North America,...
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    The mission of The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Inc. is to sponsor and sustain educational and charitable activities for the advancement and benefit of...
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    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
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    The companies under Bruker Inc. are globally leading manufacturer of analytical systems for life and materials sciences. The Bruker Nano Analytics (BNA) Division, headquartered at Bruker Nano GmbH in...
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    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
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    Alemnis enables breakthrough academic research in material science by providing leading-edge micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing...
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    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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