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Results 21 - 30 of 475 for Defect analysis
  • Oxford Instruments NanoAnalysis
    Supplier Profile
    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Minus K Technology
    Supplier Profile
    Minus K® Technology, Inc. was founded in 1993 to develop, manufacture and market our state-of-the-art vibration isolation products based on our patented negative-stiffness-mechanism technology....
  • Malvern Panalytical
    Supplier Profile
    Malvern Panalytical technologies are used by scientists and engineers in a wide range of industries and organizations to solve the challenges associated with maximizing productivity, developing better...
  • Bruker BioAFM
    Supplier Profile
    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
  • Surface Measurement Systems Ltd
    Supplier Profile
    Surface Measurement Systems Ltd develops and engineers innovative experimental techniques and instrumentation for physico-chemical characterization of complex solids. “World leaders in...
  • Nanotronics Imaging
    Supplier Profile
    Founded in 2008, Nanotronics Imaging is a high-tech, cutting edge, microscopy and software company delivering rapid testing and analysis solutions to sectors ranging from materials science, and...
  • Prior Scientific Instruments Ltd.
    Supplier Profile
    From our UK Headquarters, Prior Scientific designs and manufactures a wide range of scientific instrumentation, specialising in microscope automation and optical microscopy. This has been the core of...
  • Fries Research + Technology GmbH
    Supplier Profile
    FRT ­ Fries Research and Technology GmbH - Thomas Fries, PhD and his team of qualified, and very motivated, scientists, engineers, technicians and staff. FRT ­ a knowledge of materials and...
  • Detecting Defects in Microelectronics Using Particle Analysis
    Article - 5 Jun 2023
    This article discusses using particle size analysis techniques to detect defects in silicon carbide (SiC), a wide-bandgap semiconductor used in microelectronic devices.

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