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Results 21 - 30 of 754 for Scanning probe microscopy
  • Argonne's Center for Nanoscale Materials Dedicate New Scanning Probing Microscopy Building
    News - 21 Oct 2009
    The Center for Nanoscale Materials (CNM) at the U.S. Department of Energy's (DOE) Argonne National Laboratory dedicated its new scanning probing microscopy building recently during its annual...
  • JPK 7th International Symposium on "Scanning Probe Microscopy in Life Sciences"
    News - 29 Oct 2008
    JPK Instruments hosted the 7th international symposium on "Scanning Probe Microscopy in Life Sciences" on October 8-9th in Berlin. Nearly 100 scientists from around the world attended the...
  • Details Confirmed for 7th Annual Symposium on the Applications of Scanning Probe Microscopy (SPM)
    News - 10 Jul 2008
    JPK announces the seventh annual symposium on the applications of scanning probe microscopy (SPM) in areas such as biophysical, biochemical and medical research. It will be held on the 8-9th October...
  • Merck
    Supplier Profile
    Our pursuit is progress for people everywhere. That's why we take a closer look at things, ask questions, and think ahead. We've been around for more than 350 years, yet our majority owners...
  • Zygo Corporation
    Supplier Profile
    Zygo is a global leader in the design and manufacture of advanced metrology systems and ultra-precise optical components and assemblies. Our mission is to enable customer success by delivering...
  • Alemnis AG
    Supplier Profile
    Alemnis enables breakthrough academic research in material science by providing leading-edge micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing...
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Asylum Research - An Oxford Instruments Company
    Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • RHK Technology
    Supplier Profile
    RHK delivers compelling value and proven quality to broaden the frontiers of atomic scale research. We stand ready to meet your specifications and exceed your expectations. RHK’s surface...

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