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Results 31 - 40 of 2361 for Electron microscopy
  • Supplier Profile
    Since its founding in 1992, El-Mul Technologies has established itself as an advanced technology leader, consistently providing solutions to meet the most challenging needs of our customers in the...
  • Supplier Profile
    Nion Co. specializes in advanced electron optics, especially the optics of very-high resolution electron microscopes. Just as imaging stars through telescopes has revealed many of the secrets of the...
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    Founded in 1989, Digital Surf is a leading provider of innovative solutions for micro and nano-surface metrology for use in research laboratory, industrial and production environments. Our company is...
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    Semplor is an innovative high-tech company based in Eindhoven, The Netherlands. Eindhoven is the crucible of Electron Microscopy with its origins at Philips Electron Optics during the middle of the...
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    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...
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    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Article - 17 May 2024
    Graphene grids enhance electron microscopy imaging with high uniformity, inertness, and mechanical strength, ideal for high-resolution biological samples.
  • Article - 18 May 2021
    Wes Wigglesworth discusses Cryo EM trends and the critical role of vibration isolation in enhancing electron microscopy precision.
  • Article - 7 Apr 2015
    In this interview, Michael Zapata III, Executive Chairman at Protochips Inc, talks to AZoNano about the next generation of in situ electron microscopy.
  • Article - 25 Jul 2005
    Transmission Electron Microscopy (TEM) methods can be used to measure the mechanical, electrical and field emission properties of individual carbon nanotubes. This overview highlights the in-situ TEM...

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