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Results 31 - 40 of 287 for Ion Beam Analysis
  • Oxford Instruments Nanoscience
    Supplier Profile
    Creating high performance cryogenic and cryogen free environments for ultra low temperature and high magnetic field applications in physics, chemistry and materials science research down to the atomic...
  • AXT Pty Ltd
    Supplier Profile
    AXT is Australia’s leading supplier of analytical instruments and sample preparation equipment. Their product range caters to the materials, mining, nanotechnology, life sciences and microscopy...
  • Depth Profile Analysis Using Focused Ion Beam-Secondary Ion Mass Spectrometry
    Article - 19 Jan 2016
    Strict regulatory and energy conservation requirements imposed on the construction and design of modern buildings in recent years have provided challenges for the glass industry. Thin material-coated...
  • Sandia National Laboratories
    Supplier Profile
    Since 1949, Sandia National Laboratories has developed science-based technologies that support our national security. Today, the nearly 300 million Americans depend on Sandia's technology...
  • Protochips
    Supplier Profile
    Protochips is the leader for in situ (real-world) electron microscopy products. The revolutionary systems include Atmosphere for pressurized gas and heating, Poseidon Select for liquid; electrical and...
  • AJA International, Inc.
    Supplier Profile
    The AJA International, Inc. ATC Series Thin Film Deposition Systems are versatile coating tools that can be built in a wide variety of configurations to satisfy almost any requirement. These systems...
  • Attolight
    Supplier Profile
    Attolight, a Swiss company that originated in the EPFL Laboratory of Quantum Optoelectronics (LOEQ), has revolutionized micro-cathodoluminescence (CL).  Capitalizing on core expertise in the...
  • LatticeGear
    Supplier Profile
    LatticeGear is passionate about sample preparation and the under appreciated art of scribing and cleaving.   They help their customers get to the business of imaging and analysis faster. Their...
  • Cranfield University - Nanotechnology Centre
    Supplier Profile
    The Microsystems and Nanotechnology Centre, within the Materials Department, was established in 1994 by Professor Whatmore. Since then it has grown to 50 staff and students. The Head of Centre is Dr...
  • Atomic Force Microscope Analytical Methods Compared With Other Techniques For Measuring Surface Roughness and Surface Texture
    Article - 15 Feb 2006
    There are numerous analytical methods for establishing the surface roughness as well as the visualization of surface texture. Each of these methods has its own advantages and disadvantages. This...

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