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Results 41 - 50 of 532 for Electron Beam Analysis
  • NanoMEGAS SPRL
    Supplier Profile
    Nanomegas was established in 2004 and specializes in advanced electron diffraction techniques for TEM. It was the first to develop and commercialize Precession Electron Diffraction (PED) device...
  • Dept. of Chemistry Duke University
    Supplier Profile
    The Duke University Chemistry Department offers an exciting program of research conducted by a dynamic group of faculty and students using state of the art facilities. Over the last few years, four...
  • AJA International, Inc.
    Supplier Profile
    The AJA International, Inc. ATC Series Thin Film Deposition Systems are versatile coating tools that can be built in a wide variety of configurations to satisfy almost any requirement. These systems...
  • Molecular Vista
    Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • LatticeGear
    Supplier Profile
    LatticeGear is passionate about sample preparation and the under appreciated art of scribing and cleaving.   They help their customers get to the business of imaging and analysis faster. Their...
  • Cranfield University - Nanotechnology Centre
    Supplier Profile
    The Microsystems and Nanotechnology Centre, within the Materials Department, was established in 1994 by Professor Whatmore. Since then it has grown to 50 staff and students. The Head of Centre is Dr...
  • Electron and Ion Beam Imaging and Analysis Equipment North American Headquarters For Carl Zeiss SMT Moves To Peabody, Mass.
    News - 10 Jul 2007
    Carl Zeiss SMT Inc., a leading global provider of electron- and ion-beam imaging and analysis equipment and services, today announced that it has successfully moved its North American headquarters...
  • Atomic Force Microscope Analytical Methods Compared With Other Techniques For Measuring Surface Roughness and Surface Texture
    Article - 15 Feb 2006
    There are numerous analytical methods for establishing the surface roughness as well as the visualization of surface texture. Each of these methods has its own advantages and disadvantages. This...
  • Scientists Developed Process for Cleaning a Transmission Electron Microscope
    News - 5 Aug 2008
    A process for cleaning a transmission electron microscope without disassembling has been developed. Contaminants in the electron microscope are removed, and 100% performance is demonstrated. The...
  • High-Precision Field Emission SEM: SM-IT800
    Equipment
    The JSM-IT800 from JEOL provides high-precision field emission SEM.

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