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  • Supplier Profile
    Malvern Panalytical technologies are used by scientists and engineers in a wide range of industries and organizations to solve the challenges associated with maximizing productivity, developing better...
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    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
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    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
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    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
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    Zygo is a global leader in the design and manufacture of advanced metrology systems and ultra-precise optical components and assemblies. Our mission is to enable customer success by delivering...
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    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
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    Anton Paar Great people | Great instruments The “Anton Paar” success story began on January 4, 1922, when Anton Paar started his metalworking shop. Back then, it was hard to imagine that...
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    Supporting advanced research since 1968, Lake Shore Cryotronics is a leading innovator in measurement and control solutions for materials characterization under variable temperature and magnetic field...
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    Creating high performance cryogenic and cryogen free environments for ultra low temperature and high magnetic field applications in physics, chemistry and materials science research down to the atomic...
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    Filmetrics, Inc. was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, commercial thin-film measurement instruments cost $50,000 or more...

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