Search

Search Results
Results 1 - 10 of 715 for Scanning probe microscopes
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • RHK Technology
    Supplier Profile
    RHK delivers compelling value and proven quality to broaden the frontiers of atomic scale research. We stand ready to meet your specifications and exceed your expectations. RHK’s surface...
  • Bruker BioAFM
    Supplier Profile
    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • DME Nanotechnologie GmbH
    Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
  • Zyvex
    Supplier Profile
    Zyvex is the first molecular nanotechnology company. They carry out scientific breakthroughs into key commercial applications in the areas of Materials, Tools and Structures. Zyvex has developed...
  • Superior Research Performance and Versatility with the Innova Scanning Probe Microscope
    Article - 29 Apr 2008
    The Innova scanning probe microscope (SPM) from Bruker delivers high resolution scanning, excellent value, and a wide range of functionality for physical, life, and materials sciences.
  • AFM Probe with High-Q Factor for UHV Applications from Nanosensors - New Product
    Article - 28 Oct 2005
    Nanosensors have announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and enhanced signal to noise ratio for UHV applications. Posted October 28 2005
  • Queensgate Instruments Ltd
    Supplier Profile
    Queensgate Instruments was founded in 1979 and span out from a ground-breaking research programme at Imperial College, London. Queensgate Instruments quite literally "wrote the book" on...

Sponsored Content

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback