Atomic Force Microscopes News

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Bruker Nano Surfaces Launch Online Store for AFM Probes

The Bruker Nano Surfaces division has launched a brand new website for atomic force microscopy (AFM) probes at www.brukerAFMprobes.com.

From Bruker Nano Surfaces and Metrology 9 Aug 2011

JPK's NanoWizard AFM Used to Characterize Polymeric and Biological Materials at Chemnitz University of Technology

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to report on the research work from the Chemical Physics group of Professor Robert Magerle of the Chemnitz University of Technology.

From Bruker BioAFM 4 Aug 2011

Low Profile Isolation Table for Nanotechnology Research

Herzan LLC announces the release of The Onyx Series – the highest performing, most cost effect passive isolation table on the market. This is the first passive vibration isolation table manufactured by Herzan, which brings its expertise in environmental solutions to the passive isolation market.

24 Jul 2011

Fast Scanning Capability for Bruker AFMs Increases Research Productivity

Bruker today announced new fast scanning capabilities for the MultiMode® 8 Atomic Force Microscope (AFM). The system’s new ScanAsyst-HR feature provides a direct 6X increase in imaging rate for significantly improved research productivity.

From Bruker Nano Surfaces and Metrology 19 Jul 2011

Piezo Motor Powers High Resolution, Low Profile Rotation Table

PI (Physik Instrumente) L.P. – a leading manufacturer of precision motion control systems - has released a higher-precision version of its M-660 low profile rotary table.

From PI (Physik Instrumente) LP 10 Jul 2011

Nanoworld Launches Site Dedicated to High Speed Scanning AFM

Earlier this month, NanoWorld AG announced that it had launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM) at www.highspeedscanning.com. NanoWorld dedicates this website to the community of high speed scanning AFM users and focuses on the probe aspect of high speed scanning.

From Nanoworld AG 23 Jun 2011

Otophase to Distribute nPoint Nanopositioning Systems

nPoint Inc., the leading global manufacturer of flexure based nanopositioning systems capable of sub-nanometre positioning resolution has appointed Optophase as distributor of its products.

From Motion Solutions 22 Jun 2011

CNRS Researchers Study Molecular Switch Using STM and AFM

Researchers at the center for materials elaboration and structural studies, (CEMES) have found a connection between a molecule's geometrical shape and its charge, which makes it useful for an electromechanical system with nanometric dimensions.

From CEMES 13 Jun 2011

Researchers Study Mechanics of Tumor Cells Using Atomic Force Microscopy

Physics Professor of Clarkson University, Igor Sokolov and his team worked in collaboration with Biology Professor Craig D. Woodworth on cervical cancer cells and the details of the work was published in an article in the May 23 issue of Chemical & Engineering News.

10 Jun 2011

Great Deals on Metrology Instruments from LOT Oriel

LOT represent some of the top names in Metrology instrumentation such as KLA Tencor and Park Systems. We are currently offering the following promotions for a limited period.

From Quantum Design UK and Ireland Ltd 9 Jun 2011