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JPK ForceRobot 300 Used to Produce Single Molecule Force Spectroscopy Data at University of Nebraska

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the work from the Pharmaceutical Sciences Department of the Medical School at the University of Nebraska. The Department has selected the JPK ForceRobot® 300 system to extend their studies applying atomic force microscopy, AFM, in the measurement of single molecule force spectroscopy.

From Bruker BioAFM 7 Jun 2011

Researchers Address Molecular Mapping Challenge with AFM-IR

Anasys Instruments is pleased to report the publication and highlighting of a "hot paper" from a group of leading French scientists in the leading scientific journal, Angewandte Chemie. The paper address a molecular mapping challenge using the exciting technique of AFM-IR, the combination of an atomic force microscope (AFM) and IR spectroscopy.

18 May 2011

University of Leipzig Chooses JPK's CellHesion System for Soft Matter Research

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports that the University of Leipzig has chosen the CellHesion® 200 system for their Institute of Experimental Physics I.

From Bruker BioAFM 4 May 2011

Bruker Dimension FastScan AFM Offers Improved Imaging Speed with Nanoscale Resolution

Bruker announced the innovative and unique Dimension FastScanTM Atomic Force Microscope (AFM), which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution.

From Bruker Nano Surfaces and Metrology 3 May 2011

Seamless Integration of Light Microscopy and AFM Images

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, provides a unique software package to make the display of light microscopy images together with atomic force microscopy images a seamless exercise.

From Bruker BioAFM 19 Apr 2011

NIST Develops New Way to Measure Wear of AFM Probes in Real Time

Scientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the microscopic probes used to study nanoscale structures in situ and as it’s happening.

30 Mar 2011

JPK Instruments Launch NanoWizard 3 NanoScience AFM system

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continues to expand its family of high performance research systems with the announcement of the availability of the NanoWizard® 3 NanoScience AFM system.

From Bruker BioAFM 23 Mar 2011

LOT to Demonstrate the Capabilities of the Park XE-100 AFM

LOT are offering demonstrations of the Park XE-100 AFM at our offices in Leatherhead between Wednesday 11th May and Friday 13th May. This is an ideal opportunity to see the XE-100 and meet technical experts from Park Systems.

From Quantum Design UK and Ireland Ltd 22 Mar 2011

JPK Instruments Wins Award for Atomic Force Microscopy Technology

JPK Instruments (JPK), a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to announce that JPK has received an award for its future technologies from th...

From Bruker BioAFM 21 Mar 2011

PI Releases New Catalog of Planar Piezo Scanners for AFM and SPMs

PI (Physik Instrumente) L.P. -- a leading manufacturer of piezo nanopositioning systems and scanners for microscopy, bio-medical and nanotechnology applications -- has released a new catalog on planar piezo scanners for Atomic Force and Scanning Probe microscopy.

From PI (Physik Instrumente) LP 10 Mar 2011