Atomic Force Microscopes News

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AFM Helps to Record Sub-Nano Sounds of Insects

A team of Clarkson University scientists led by Prof. Igor Sokolov are using atomic force microscopy (AFM) to record sounds emanating from inside living insects like flies, mosquitoes and ladybugs.

14 May 2010

Using Atomic Force Microscopy to Non-Destructively Image Surface of Biological Cell

Atomic force microscopy, a tactile-based probe technique, provides a three-dimensional nanoscale image of a material by gliding a needle-like arm across the material's surface. The core of AFM imaging workhorse is a cantilever with a sharp tip that deflects as it encounters undulations across a surface.

From Lawrence Berkeley National Laboratory 20 Apr 2010

Researchers Use AFM Images to Study Structure of Amyloid Fibers

Researchers at ETH Zurich, EPF Lausanne and at the University of Fribourg have evidenced a basic general mechanism describing how filamentous proteins assemble into ribbon like structures, the so-called Amyloid fibrils.

17 Apr 2010

Researchers Study Structure of Few Nanometer Thick Fibers Using AFM Images

The Atomic Force Microscope depicts on its screen the few nanometer thick and few micrometer long fibers as white flexible sticks, crisscrossing the surface on which they are deposited. The very peculiar property of ...

12 Apr 2010

Agar Scientific Announces Availability of SuperFlat AFM from Kleindiek

Agar Scientific is pleased to announce the availability of the SuperFlat AFM from Kleindiek to combine the imaging power of SEM and AFM.

From Kleindiek Nanotechnik 7 Apr 2010

Veeco Launch New AFM for Physical and Life Sciences

Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopy technology to the nanoscience community, announced today the Dimension(R) Edge(TM) Atomic Force Microscope (AFM) System for physical and life sciences investigation.

From Veeco 10 Mar 2010

Super Strong Carbon Tip Suited to AFM's and data Storage Applications

German and US researchers have produced a super-sharp, strong, and resilient carbon tip that has earned top place as the industry's current benchmark. Funded by the EU, the diamond-like tip is 3,000 times more wear-resistant at the nanoscale than a silicon oxide tip, making it ideal for use in atomic imaging, probe-based data storage, and other emerging applications.

1 Mar 2010