Atomic Force Microscopes News

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Picoscale Stability in a Room-Temperature AFM

Forget dancing angels, a research team from the National Institute of Standards and Technology (NIST) and the University of Colorado (CU) has shown how to detect and monitor the tiny amount of light reflected directly off the needle point of an atomic force microscope probe.

24 Mar 2009

Noliac Piezoelectric Actuators are Ideally Suited to Atomic Force Microscopes

Applying 60 volts grants you 0.01 mm of motion with a 5x5x10 mm multilayer
piezoelectric actuator from Noliac.
A multilayer piezoceramic actuator is thus perfect for many applications, e.g.
in atomic force microscopy.

24 Mar 2009

World's First Metallic Needle AFM Probes Now Available from Nanoscience Instruments

Nanoscience Instruments, a premier distributor of nanotechnology instrumentation and supplies, today announced the worldwide distribution of NaugaNeedles' new line of metallic atomic force microscopy (AFM) probes.

24 Mar 2009

Course Covers Essential AFM Topics that Biologists Need and Want to Learn About

Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its AFM in Biology Class to be held June 3 to June 5, 2009 in Santa Barbara, California.

10 Mar 2009

Participate in the World's First Global Market Study on SPMs and AFMs

AFM and STM practitioners from around the world have been invited to participate in the first ever global market study on AFM and STMs.

4 Mar 2009

New Standard in AFM and Light Microscopy Integration

Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, announced today the release of its BioScope™ Catalyst™ Life Science Atomic Force Microscope (AFM). The Catalyst provides an unprecedented level of integration between atomic force microscopy and light microscopy.

2 Mar 2009

Scientists Develop New Type of Porous Material that Could Be Used to Separate Gas Mixtures

The international team of scientists that made the material, including Masaki Takata of RIKEN's Harima Institute, used x-rays to reveal that it contains ordered channels of two different sizes*. The smaller channels, crowded by napthalene units, are just 0.3 nanometers (billionths of a meter) across, while the larger channels are 0.77 nanometers across.

25 Feb 2009

NanoWorld Releases AFM and SPM Probes Product Brochure in Nine Languages

NanoWorld - a leading manufacturer of probes for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) - announced the publication of its product brochure in nine languages. NanoWorld's product brochure i...

From Nanoworld AG 23 Feb 2009

Large-Sample AFM with 'Small-Sample' Resolution

Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopes (AFMs) to the nanoscience community, announced today the release of its Dimension® Icon(TM) AFM. Building upon the world's most utilized large-sample AFM platform, the latest member of Veeco's Dimension product line delivers the highest resolution, best ease-of-use, and fastest time-to-results of any large-sample AFM on the market today.

2 Feb 2009

Visualization and Manipulation of Atoms Using Nanotechnology and AFM

An international team of scientists, among them researchers from the department of Theoretical Condensed Matter Physics of the Universidad Autónoma de Madrid (UAM), present a new method to manipulate atoms. Nanot...

9 Jan 2009