Farfield Scientific Awarded Japanese Patent for DPI Waveguide Technology

Farfield Scientific Limited Building on a patent portfolio of some 20 applications, this month Farfield have been granted a patent in Japan (patent number 10-523311) covering the waveguide technology underpinning Farfield’s Dual Polarisation Interferometry measurement. This is a particularly broad ranging patent with all 18 claims fully accepted and embodies a completely new concept in measurement excellence. Farfield CEO, Gerry Ronan, commented, “I am particularly pleased with this as our protection now encompasses the USA, Europe and the Far East. The Japanese market is one of the most exciting in the world for molecular scale research and we are delighted to have been successful in this application”.