Posted in | News | Nanomaterials | Nanoenergy | Nanoanalysis | Nanooptics and Nanophotonics

Characterizing Thin Film Uniformity Just Got Easier with Introduction of AccuMap-SE

Dec 3 2008

Characterizing thin film uniformity of large panels just got easier. The AccuMap-SER from J. A. Woollam combines a high-speed M-2000R spectroscopic ellipsometer with fast mapping for large areas. Gain confidence about your coatings that only accurate spectroscopic ellipsometry measurements can provide. The broad spectral range of the M-2000 is well suited to all thin films in photovoltaic and flat panel display applications.

Map uniformity of film thickness and optical constants for a wide range of coatings:

  • Amorphous, Microcrystalline and Polycrystalline Silicon
  • CIGS
  • CdTe/CdS
  • Transparent Conductive Oxides (ITO, SnO2:F, AZO...)

For more information please contact Heath Young on 01372 378822, e-mail [email protected]

http://www.lot-oriel.com/site/site_down/woo_accumapse_uk01.pdf

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