Posted in | News | Microscopy

Ambios Technology Introduces NEW Q-Scope White Light Interferometer/SPM

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Dec 10 2008

Q-View is a micro-interferometer module that has been seamlessly integrated into the Q-Scope SPM. This combination provides two synergistic technologies on a single platform. With the addition of interferometric technology to the Q-Scope SPM, Ambios is enabling the research community of AFM users. How many SPM users wish they could just take a quick large area scan to characterize their sample surface?

Q-View interferometer mode can take a 500 micron scan with nanometer resolution in a few seconds; switch to SPM mode and they can zoom in on the area of interest and image and measure in the sub-angstrom level. The interferometer mode and SPM mode both run off a new version of ScanAtomic software in real time and Q-Port Image rendering software, so the user can run two technologies on one instrument by switching from AFM Scan Head to Q-View Interferometer module. There are many great new features including multi scan stitching which can stitch together multiple images in SPM or interferometer mode, Motorized Z-stage with auto focus, and much much more

For more information please go to

http://www.lot-oriel.com/site/pages_uk_en/products/profilers/profilers.php

or contact Heath Young on 01372 378822, e-mail [email protected]

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