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Results 11 - 20 of 1145 for SEM
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Gatan, Inc.
    Supplier Profile
    Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are...
  • Oxford Instruments NanoAnalysis
    Supplier Profile
    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...
  • TMC Vibration Control
    Supplier Profile
    TMC is a global leader in precision floor vibration isolation systems with over 50 years of experience. Major research centers, OEM and end-user semiconductor manufacturers, drug discovery companies,...
  • DME Nanotechnologie GmbH
    Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
  • TESCAN SEM/FIB-SEM with Integrated Raman Spectrometry
    Equipment
    This page details the capabilities of the TESCAN SEM/FIB-SEM with integrated Raman spectrometry.
  • Semplor
    Supplier Profile
    Semplor is an innovative high-tech company based in Eindhoven, The Netherlands. Eindhoven is the crucible of Electron Microscopy with its origins at Philips Electron Optics during the middle of the...
  • Using Nanoindentation for In-Situ SEM Material Testing
    Article - 4 Jul 2019
    This article discusses in-situ SEM material testing using nanoindentation.
  • JEOL USA, Inc.
    Supplier Profile
    JEOL USA is a wholly-owned subsidiary of JEOL Ltd in Japan, a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core...
  • NanoLED SEM Image from TU/E Wins Oxford Instruments SEM Competition
    News - 3 Jun 2015
    The nanoLED SEM image (pictured) by Eindhoven University of Technology (TU/e) recently won a competition held by Oxford Instruments Plasma Technology, and chosen from a large number of entries, all...

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