Search

Search Results
Results 41 - 50 of 2274 for Electron microscopes
  • Alemnis AG
    Supplier Profile
    Alemnis enables breakthrough academic research in material science by providing leading-edge micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing...
  • Digital Surf
    Supplier Profile
    Founded in 1989, Digital Surf is a leading provider of innovative solutions for micro and nano-surface metrology for use in research laboratory, industrial and production environments. Our company is...
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Mad City Labs: Nanopositioning, Nanopositioners
    Supplier Profile
    Mad City Labs, Inc is a leading manufacturer of flexure based nanopositioning systems capable of sub-nanometer positioning resolution. Our product line covers the entire spectrum of nanopositioning...
  • NanoImages, LLC
    Supplier Profile
    NanoImages, LLC is the proud North American distributor (US and Canada) for the family of Tabletop Scanning Electron Microscopes from SEC Co., Ltd. (Suwon, South Korea). As a full-service company, we...
  • Particle Measuring Systems
    Supplier Profile
    Particle Measuring Systems has 35 years experience designing, manufacturing, and servicing microcontamination monitoring instrumentation and software used for detecting particles in air, liquid, and...
  • Hiden Analytical
    Supplier Profile
    2022 marks Hiden Analytical’s 40th year of continuous and independent operation in the field of mass spectrometry.  Driven by customer and application focussed innovation, a unique and...
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
  • Phenom Desktop SEM Closing the Imaging Gap Between Optical and Electron Microscopy
    Article - 19 Aug 2008
    The Phenom is a new tabletop scanning electron microscope (SEM) which combines the high magnification of electron microscopy with the ease of use of optical microscopy to improve performance in a...
  • Carbon Nanotubes - Measuring the Mechanical, Electrical and Field Emission Properties of Nanotubes
    Article - 25 Jul 2005
    Transmission Electron Microscopy (TEM) methods can be used to measure the mechanical, electrical and field emission properties of individual carbon nanotubes. This overview highlights the in-situ TEM...

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback