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Results 71 - 80 of 1069 for Atomic Force Microscopy
  • Linkam Scientific Instruments
    Supplier Profile
    Linkam develops and manufactures a broad range of temperature and environmental control stages for both OEMs and end-users. From high to cryo temperatures as well as humidity, electrical connections,...
  • Pittcon
    Supplier Profile
    The mission of The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Inc. is to sponsor and sustain educational and charitable activities for the advancement and benefit of...
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Surface Measurement Systems Ltd
    Supplier Profile
    Surface Measurement Systems Ltd develops and engineers innovative experimental techniques and instrumentation for physico-chemical characterization of complex solids. “World leaders in...
  • DME Nanotechnologie GmbH
    Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • PerkinElmer Inc.
    Supplier Profile
    At PerkinElmer, we design, manufacture and deliver advanced technology solutions that address the world's most critical health and safety concerns, including maternal and fetal health, clean water...
  • Molecular Vista
    Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Atomic Force Microscopy (AFM) Vs Photo-Induced Force Microscopy (PiFM)
    Article - 27 Jul 2017
    There is a new form of microscopy available on the marketplace known as photo-induced force microscopy (PiFM), which shows great similarities, and can be used in conjunction, with atomic force...
  • On-Demand Videos: Atomic Force Microscopy (AFM) Master Class
    Video
    The essential short course for researchers using atomic force microscopy (AFM).

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