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Metryx, IMEC and Intel to Assess Mass Metrology Applications for 20-nm Node and Below

Metryx, a provider of innovative nanotechnology related mass metrology devices, declared its involvement in the joint European Semiconductor Equipment Assessment Leveraging Innovation (SEAL) project.

16 Jun 2011

Veeco Receive Another Order for a MaxBright MOCVD System

Veeco Instruments Inc. (Nasdaq: VECO) today announced that Tsinghua Tongfang Company, a Beijing-based publicly listed division of the Tsinghua Holdings Company Limited, has placed an order for Veeco's new TurboDisc(R...

From Veeco 15 Jun 2011

COIN is a Key Supporter of the Upcoming COMS 2011 Conference

The Center of Innovation for Nanobiotechnology (COIN) is a Key Supporter of the upcoming COMS 2011 conference to be hosted at the Grandover Resort in Greensboro, NC on August 28th through September 1st. This conference d...

14 Jun 2011

Nanometrics Releases NanoCD Suite Optical Critical Dimension Analysis Solution

Nanometrics, a supplier of advanced, automated process control metrology systems for fabricating high-brightness LEDs, solar photovoltaics, semiconductors and data storage devices, has released a novel optical critical dimension (OCD) analysis solution having advanced recipe building, calculating and modeling capabilities.

13 Jun 2011

Ecliptek Unveils Compact Current Mode Logic MEMS Clock Oscillator Series

Ecliptek has unveiled six current mode logic (CML) MEMS clock oscillator series called EMML oscillator series that can fulfill the demands of design engineers for compact oscillators using minimum input voltage.

10 Jun 2011

GLOBALFOUNDRIES to Use Infinisim’s RASER to Validate On-Chip Variation Models

Infinisim has announced the selection of its major verification product RASER by GLOBALFOUNDRIES to validate their on-chip-variation (OCV) models developed from its 28-nm technology qualification vehicles (TQV).

From GlobalFoundries 8 Jun 2011

PI Release New Catalog Covering Nanopositioning Stages

PI (Physik Instrumente) L.P. -- a leading manufacturer of nanopositioning stages and precision motion-control equipment for bio-medical, semiconductor, imaging and nanotechnology applications -- has released a new catalog on nanopositioning systems.

From PI (Physik Instrumente) LP 7 Jun 2011

TSMC Uses MunEDA’s Circuit Analysis Software for TSMC 28-nm AMS Reference Flow 2.0

MunEDA has declared that the company’s WiCkeD circuit analysis software was incorporated by TSMC for its TSMC AMS (analog/mixed-signal) Reference Flow 2.0, an important component of TSMC 28-nm design process.

6 Jun 2011

Mentor Graphics Completes 28-nm Signoff-Ready Digital Design Flow

Mentor Graphics has declared the completion of its 28-nm signoff-ready digital design flow for the technology of GLOBALFOUNDRIES.

6 Jun 2011

TSMC’s 28-nm Analog-Mixed-Signal Reference Flow 2.0 Validates Synopsis’ Custom Design Solution

Synopsys, pioneer in IP and software for semiconductor development, production and verification, has declared that through its collaboration with TSMC, the 28-nm Analog/Mixed-Signal (AMS) Reference Flow 2.0 of TSMC will validate the custom design solutions of Synopsis.

From Synopsys, Inc. 4 Jun 2011