Posted in | MRS 2011 Fall Meeting Video Interviews | Nanoanalysis

Leica's DCM 3D Surface Metrology Tool

The DCM 3D surface metrology tool from Leica features a confocal microscope and interferometer with LED illumination and CCD detector. The interferometer and confocal microscope have resolutions of 0.1nm and 3.5nm respectively.

The DCM 3D caters to various substrates and can resolve features from the sub micron range all the way up to the millimeter range. It is able to generate full 3-dimensional surface maps and measure such things as topographical roughness and step heights.

The DCM 3D is fast an accurate and suited to a wide range of applications such as life sciences, semiconductors and solar.

Run time - 3:18 min

DCM 3D Surface Metrology Tool from Leica

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