Search

Search Results
Results 21 - 30 of 1212 for Scanning electron microscopy
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
  • Sigma Aldrich
    Supplier Profile
    Sigma-Aldrich® is a leading high-technology company. Through our Materials Chemistry Centers of Excellence in research and manufacturing we develop advanced, enabling materials for your...
  • Particle Technology Labs
    Supplier Profile
    Particle Technology Labs is a premier service laboratory, dedicated to quality particle size and characterization services. We are a trusted advisor to the world’s leading pharmaceutical,...
  • Raith
    Supplier Profile
    Raith is a leading precision technology solution provider for nanofabrication, electron beam lithography, focused ion beam fabrication, nanoengineering and reverse engineering applications. Customers...
  • MTSU Researchers Optimize Focused Ion Beam–Scanning Electron Microscopy for Plant Cell Imaging
    News - 10 Jun 2014
    Plant cells are beginning to look a lot different to Dr. A. Bruce Cahoon and his colleagues at Middle Tennessee State University (MTSU). They've adopted a new approach that combines the precision...
  • Environmental Scanning Transmission Electron Microscopy (ESTEM) Images with Atomic Resolution Under Controlled Environmental Conditions
    News - 13 Jun 2013
    A new microscopy setup, referred to as environmental scanning transmission electron microscopy (ESTEM) in a new paper published in Wiley's Annalen der Physik, provides the possibility of imaging...
  • Researchers to Develop Four-Dimensional Scanning Ultrafast Electron Microscopy to Study Materials Structure
    News - 30 Jun 2011
    Scientists who discovered an innovative three-dimensional microscope method are extending this technology to be suitable for a range of applications in biological research, medicine, and production of...
  • FEI's Phenom Bridges the Gap between Optical and Scanning Electron Microscopy
    News - 26 Jun 2007
    FEI has released its new Phenom™ microscope, an innovative system that bridges the critical price and performance gap between optical and scanning electron microscope (SEM) technologies....
  • Kratos Analytical, Ltd.
    Supplier Profile
    For the last 46 years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. As we approach our...

Sponsored Content

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback