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Results 51 - 60 of 306 for SPM
  • Minus K Technology
    Supplier Profile
    Minus K® Technology, Inc. was founded in 1993 to develop, manufacture and market our state-of-the-art vibration isolation products based on our patented negative-stiffness-mechanism technology....
  • Ludwig-Maximilians-Universität München
    Supplier Profile
    Our research is centered on Nanomanipulation, Self-assembly, SPM development, NanoBioScience, Nanogeology, NanoTribology and NanoBioInformatics.
  • Applied NanoStructures
    Supplier Profile
    Applied NanoStructures, Inc. develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. They leverage extensive...
  • Advanced Microscopy, SPM, AFM and SEM Image Processing - SPIP™ Software
    Equipment
    SPIP™ is a professional software package that provides industrial and academic researchers with an advanced toolkit for working with microscope images, profiles and force curve data, including...
  • Demonstration of Fast Scanning of Nanolithography Pattern on Ti Film
    Video
    Video demonstration by AIST-NT. Local anodic oxidation on Ti film using the vector SPM nanolithography technique. Image size 3x3 µm, line height 3 nm, 400x400 points. The scanning rate is changing...
  • The OmegaScope AFM-Raman from AIST-NT
    Video
    AIST-NT's Alexander Yalovenko shows us their OmegaScope AFM-Raman instrument. Based on their proven fast scanning Smart-SPM, The OmegaScope includes either single or 3 laser Raman capabilities that...
  • Neos AFM from Bruker AXS - Features and Applications
    Video
    The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up.
  • The Asylum Cypher High Resolution AFM - Key Features
    Video
    You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher(TM) AFM, the first...
  • The Smart SPM/AFM from AIST-NT - Ease of Use Demonstration
    Video
    Marshall Bates and Andrey Krayev from AIST-NT demonstrate the ease of use of the AIST SmartSPM/AFM. From loading a sample to starting to take measurements can be completed in 1-2 minutes, at atomic...
  • Ambios Technology Q-View SPM/Interferometer - Capabilities
    Video
    Rick Olds from Ambios Technology shows us through the Q-View. The Q-View which combines scanning probe microscopy (SPM) and interferometer which are interchangeable for taking surface roughness and...

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